SpectralEmissivity & Emittance

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ASTM E307 – 72(2008) Standard Test Method for Normal Spectral Emittance

At Elevated Temperatures
Developed by ASTM Subcommittee: E21.04, on Space Simulation Test Methods, and in the Annual Book of ASTM Standards, Volume 15.0 Space Simulation; Aerospace and Aircraft; Composite Materials

Quoting from the standard’s Scope:

1. Scope

1.1 This test method describes a highly accurate technique for measuring the normal spectral emittance of electrically conducting materials or materials with electrically conducting substrates, in the temperature range from 600 to 1400 K, and at wavelengths from 1 to 35 ?m.

1.2 The test method requires expensive equipment and rather elaborate precautions, but produces data that are accurate to within a few percent. It is suitable for research laboratories where the highest precision and accuracy are desired, but is not recommended for routine production or acceptance testing. However, because of its high accuracy this test method can be used as a referee method to be applied to production and acceptance testing in cases of dispute…

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Spectral Emittance of Ablation Chars, Carbon, and Zirconia to 3700 deg K

Hemispherical Spectral Emittance of Ablation Chars, Carbon, and Zirconia to 3700 deg K

Abstract: The initial results of the application of special optical techniques to high-temperature emittance and reflectance studies of an ablation-material char and certain other refractory materials representative of those present in ablation residues formed during aerospace reentry operations are presented. Spectral hemispherical emittance and reflectance were determined with an image pyrometer integrated with an arc-imaging furnace for carbon, graphite, zirconia, and a phenolic-nylon ablation-material char at wavelengths from 0.37 micrometer to 0.72 micrometer for temperatures from 2100 deg K to 3700 deg K. The data obtained are compared with those of other investigations to the extent that the existence of comparable data permits. Surface-roughness properties of the materials studied were determined from measurements made with a light-section microscope. The dependence of the spectral hemispherical emittance of oxidized carbon at a wavelength of 0.65 micrometer on its surface-roughness properties was investigated experimentally and the emittance was found to be a linear function of the root-mean-square slope of the surface when the roughness is large compared with wavelength. p3

Description: Technical note
Pages: 31
Report Date: MAR 65
Report Number: A107703