SpectralEmissivity & Emittance

| Useful Data | Practices Measuring or Avoiding | Background & Theory|

Experimental verification of a multiband system for non-contact temperature measurements

Proc. SPIE 5258, 198 (2003); doi:10.1117/12.544574
Conference Title: IV Workshop on Atomic and Molecular Physics
Conference Chair: Jozef Heldt

Abstract

Adam Mazikowski and Marcin Gnyba
Gdansk Univ. of Technology (Poland)
Recent studies about non-contact temperature measurement concern passive multiband radiometric systems. These systems give a potential possibility of accurate temperature measurements in case of unknown and wavelength depended emissivity of the examined object. Modeling of such systems, what is usually the first stage of system designing, requires acceptance of several simplifications and approximations. In this paper an experimental verification of modeling result is performed. Based on developed experimental setup some tests are performed. It allows us to determine some systems parameters and whole system estimation.Read More

Noncontact multiband emissivity measurements

Proc. SPIE 5124, 240 (2003); doi:10.1117/12.517121
Conference Title: Optoelectronic and Electronic Sensors V
Conference Chairs: Wlodzimierz Kalita

Abstract

Adam Mazikowski
Gdansk Univ. of Technology (Poland)

During last decade an increasing interest in passive multiband systems for temperature measurement was noted. However, recent studies showed that multiband systems are capable of producing accurate results of non-contact temperature measurement only in limited number of applications. Available literature about passive multiband systems concentrated exclusively on problem of temperature measurements too. A model of a passive multiband system for non-contact emissivity measurement has been developed and presented in this paper. Simulations carried out using this model showed that it is possible to achieve reasonable accuracy of emissivity measurements with passive multiband systems and these systems can be considered as an attractive solution for emissivity measurements in industrial conditions.Read More