A Comparison of Laser Polarimetry and Integrating Sphere Reflectometry: Proceedings of the Fifteenth Symposium on Thermophysical Properties, Part I

Authors: Seifter A.1; Boboridis K.2; Obst A.W.2

Source: International Journal of Thermophysics, Volume 25, Number 2, March 2004 , pp. 547-560(14)

Publisher: Springer

Abstract:

Both integrating sphere reflectometry (ISR) as well as laser polarimetry have their advantages and limitations in their ability to determine the normal spectral emissivity of metallic samples. Laser polarimetry has been used for years to obtain normal spectral emissivity measurements on pulse-heated materials. The method is based on the Fresnel equations, which describe reflection and refraction at an ideally smooth interface between two isotropic media. However, polarimetry is frequently used with surfaces that clearly deviate from this ideal condition. Questions arise with respect to the applicability of the simple Fresnel equations to non-specular surfaces. On the other hand, reflectometry utilizing integrating spheres provides a measurement of the hemispherical spectral reflectance, from which the normal spectral emissivity can be derived. ISR provides data on spectral-normal-hemispherical reflectance and, hence, normal spectral emissivity for a variety of surfaces. However, the resulting errors are minimal when both the sample and the reference have a similar bidirectional reflectance distribution function (BRDF). In an effort to explore the limits of polarimetry in terms of surface roughness, room temperature measurements on the same samples with various degrees of roughness were performed using both ISR and a laser polarimeter. In this paper the two methods are briefly described and the results of the comparison are discussed.

Keywords: emissivity; integrating sphere; laser polarimetry; reflectometry; rough surfaces; roughness

Document Type: Research article

Affiliations: 1: Los Alamos National Laboratory, Physics Division (P-23), MS H803, Los Alamos, New Mexico 87545, U.S.A., Email: seif@lanl.gov 2: Los Alamos National Laboratory, Physics Division (P-23), MS H803, Los Alamos, New Mexico 87545, U.S.A.