NORMAL SPECTRAL EMITTANCE, 800-1400 K, Authors: Harrison, W.N. ; Richmond, J.C. ; Skramstad, H.K.
From the Energy Citations Database, OSTI IdentifierOSTI ID: 4830164
Technical Report, WADC-TR-59-510(Pt.III), National Bureau of Standards, Washington, D.C.,1961 Sep 01
The equipment for direct measurement of normal spectral emittance was extensively modified by incorporation of a new external optical system that increased the amount of radiant energy available for measurement by a factor of about 10, and other associated changes. The test procedure was modified by incorporation of a zero line” correction. The equipment was calibrated by means of sector-disk attenuators which passed known fractions of the radiant flux from a blackbody furnace. Working standards of normal spectral emittance were prepared, calibrated, and shipped. An equation relating the normal spectral emissivity of a metal to five other parameters of the metal, each of which makes a non-linear contribution to the emissivity, was solved for one set of data by long hand” methods. Some progress was made in setting up a program for solution of the equation by use of an electronic computer. Equipment for the automatic recording of spectral emittance data in a form suitable for direct entry into an electronic computer, and on-line computation from spectral emittance data of total emittance or solar absorptance, was designed. Specifications for the equipment were prepared and bids received preparatory to placing an order for its procurement. (auth)
ASTM E423 – 71(2002) Standard Test Method for Normal Spectral Emittance at Elevated Temperatures of Nonconducting Specimens
Developed by Subcommittee: E21.04 |Book of Standards Volume: 15.03
1.1 This test method describes an accurate technique for measuring the normal spectral emittance of electrically nonconducting materials in the temperature range from 1000 to 1800 K, and at wavelengths from 1 to 35 m (microns?). It is particularly suitable for measuring the normal spectral emittance of materials such as ceramic oxides, which have relatively low thermal conductivity and are translucent to appreciable depths (several millimetres) below the surface, but which become essentially opaque at thicknesses of 10 mm or less…”
“2. Referenced Documents
E349 Terminology Relating to Space Simulation
emittance; infrared emittance; material radiative property; radiative heat transfer; spacecraft thermal control; spectral normal emittance; thermal radiation; ICS Number Code 49.025.01″
San Diego CA, USA –Surface Optics’ ET10 measures emissivity values in two most commonly used spectral regions, 3 to 5 and 8 to 12 microns.
Its main application is to produce emissivity values for the infrared cameras.
Advanced IR cameras require the input of an emissivity value for accurate temperature calculations. The emissivity values obtained from tables can be far from real leading to large temperature uncertainties.
The ET10 can be used in the lab or in the field and on small or large objects. With the ET10 one can measure emissivity of any surface in just a few seconds.
IR Emission Spectroscopy of Molten Salts and Other Liquids Using Thick Samples as Reference
J. Hvistendahl, E. Rytter, and H. A. Øye
Applied Spectroscopy, Vol. 37, Issue 2, pp. 182-187 (1983)
“The IR emittance of liquids relative to a blackbody is dependent on the reflectivity at the surface of the sample. This dependency leads to distortions in the bandshapes except when the absorption coefficient or the sample thickness is very low. The use of an opaque (i.e. very thick) sample as a reference eliminates the distortions in the bandshapes. A new emittance ?* = (emission of a thin sample)/(emission of an opaque sample) has been introduced. A theoretical analysis as well as experimental work on chloroaluminate melts demonstrate that the emittance ?* gives a better representation of the ideal sample property of interest, i.e., the internal transmittance of the sample, than the usual emittance with a blackbody as a reference.”
J. Hvistendahl, E. Rytter, and H. A. Øye, “IR Emission Spectroscopy of Molten Salts and Other Liquids Using Thick Samples as Reference,” Appl. Spectrosc. 37, 182-187 (1983)
Emittance measurements on infrared windows exhibiting wavelength dependent diffuse transmittance
S. E. Hatch
Applied Optics, Vol. 1, Issue 5, pp. 595-601
S.E. Hatch, “Emittance measurements on infrared windows exhibiting wavelength dependent diffuse transmittance,” Appl. Opt. 1, 595-601 (1962)