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Spectral emissivity from 2 micrometers to 15 micrometers

Measurement of spectral emissivity from 2 micrometers to 15 micrometers
Charles D. Reid and E. D. McAlister
JOSA, Vol. 49, Issue 1, pp. 78- (1959)

C. D. Reid and E. D. McAlister, “Measurement of spectral emissivity from 2 micrometers to 15 micrometers,” J. Opt. Soc. Am. 49, 78- (1959)

Emissivity measurement and temperature correction accuracy considerations

Authors: Madding, Robert P.
Affiliation: AA(Inframetrics, Inc.)
Proc. SPIE Vol. 3700, p. 393-401, Thermosense XXI, Dennis H. LeMieux; John R. Snell; Eds. (SPIE Homepage)
Publication Date:03/1999
Origin:SPIEAbstract Copyright:
(c) 1999 SPIE–The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Bibliographic Code: 1999SPIE.3700..393M
Abstract: Extraction of temperatures or temperature differences with thermography is not possible without knowledge of the target emissivity…

Polarized spectral emittance from periodic micromachined surfaces. I. Doped silicon: The normal direction

Peter J. Hesketh, Jay N. Zemel & Benjamin Gebhart ; Physical Review B.37.10795
VOLUME 37, NUMBER 18 1988

From the Abstract: The normal, polarized spectral (3 um <=lambda =>14um) emittances of highly doped, micromachined, periodic structures on heavily phosphorus-doped (110) silicon ([P]?5×1019cm-3) were measured for …..

Systematic Errors in the Measurement of Emissivity Caused by Directional Effects

In the Optics InfoBase, by the American Institute of Physics’ Optical Society of America:
Authors: Abraham Kribus, Irna Vishnevetsky, Eyal Rotenberg, and Dan Yakir

Applied Optics, Vol. 42, Issue 10, pp. 1839-1846
Keywords (OCIS):
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances…  » View Full Text: PDF