Spectral Emissivity & Emittance

Spectral reflectance and emittance of particulate materials
A. G. Emslie and J. R. Aronson
Applied Optics, Vol. 12, Issue 11, pp. 2563-

Citation
A. G. Emslie and J. R. Aronson, “Spectral reflectance and emittance of particulate materials,” Appl. Opt. 12, 2563- (1973)

Spectral emissivity of hydrogen chloride from 1000-3400 cm-1 V
V. Robert Stull and Gilbert N. Plass
JOSA, Vol. 50, Issue 12, pp. 1279- (1960)

Citation
V. R. Stull and G. N. Plass, “Spectral emissivity of hydrogen chloride from 1000-3400 cm-1 V,” J. Opt. Soc. Am. 50, 1279- (1960)

Authors: Madding, Robert P.\
Affiliation: AA(Inframetrics, Inc.)
Publication:
Proc. SPIE Vol. 3700, p. 393-401, Thermosense XXI, Dennis H. LeMieux; John R. Snell; Eds. (SPIE Homepage)
Publication Date:03/1999
Origin:SPIEAbstract Copyright:
(c) 1999 SPIE–The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Bibliographic Code: 1999SPIE.3700..393M
Abstract: Extraction of temperatures or temperature differences with thermography is not possible without knowledge of the target emissivity…

A project under the Tufts University Research for Undergraduates 2000 Program described both theory and experiments related to welding of metals. Its report is online (CLICK HERE FOR FULL REPORT) and the Abstract is below.

Abstract

“The basic assumption behind the operating principle of modern thermal imaging thermometers is a “graybody approximation”. For a graybody, the emittance, reflectance and transmittance are constant for all wavelengths within the wavelengths within the waveband over which the instrument measures.

“In reality however, these factors change, and for applications that take place over a wide temperature range, the emissivity variation needs to be taken into account. This work suggests a method for an in-process emissivity identification and adaptation in order to dynamically calibrate infrared temperature measurement systems for applications like heat treatment, welding, cutting etc. A series of experiments has proven that once the spatial and temporal components of emissivity are decoupled, a model can be developed, which in conjunction with direct IR radiosity monitoring can provide information about the required emissivity compensation.”

PJ Hesketh, JN Zemel, B Gebhart - Physical Review B, 1988 - APS Polarized spectral emittance from periodic micromachined surfaces. II. VOLUME 37, NUMBER 18

From the Abstract:The polarized directional spectral (3 um <=lambda =>14um) emittances (PDSE’s) of highly doped, micromachined, periodic structures on silicon were measured…

Peter J. Hesketh, Jay N. Zemel & Benjamin Gebhart ; Physical Review B.37.10795
VOLUME 37, NUMBER 18 1988

From the Abstract: The normal, polarized spectral (3 um <=lambda =>14um) emittances of highly doped, micromachined, periodic structures on heavily phosphorus-doped (110) silicon ([P]?5×10¹⁹ cm^-3) were measured for …..

Author: Guazzoni, Guido E.¹

Source: Applied Spectroscopy, Volume 26, Issue 1, Pages 1-113 (January/February 1972) , pp. 60-65(6)

Publisher: Society for Applied Spectroscopy

Abstract: Normal spectral emittance data are reported for solid specimens of the oxides of erbium, samarium, neodymium, and ytterbium… over the spectral range ..0.5-5.0 um and at sample temperatures from 1540 up to 1870 K.

The full text article is available for purchase at US$20.00 plus tax.

(CLICK ON GRAPH TO ENLARGE)
Almost everyone who attends the SPIE DSS Exposition has received a gold-plated paper clip from Mr. David Epner, personally. Well, the gold costing that Epner supplies to the optics industry has some interesting infrared reflectance (and emittance) properties.

Those properties, specifically the hemispherical spectral reflectivity in the near, mid and far infrared is now available for all to view first hand on the Epner website. A copy of the curve and the data related to it can be downloaded from the site, too.

In the Optics InfoBase, by the American Institute of Physics’ Optical Society of America:
Authors: Abraham Kribus, Irna Vishnevetsky, Eyal Rotenberg, and Dan Yakir

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Applied Optics, Vol. 42, Issue 10, pp. 1839-1846
Keywords (OCIS):
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
Abstract
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances…  » View Full Text: PDF

Hemispherical Spectral Emittance of Ablation Chars, Carbon, and Zirconia to 3700 deg K
Authors: R. G. Wilson; NATIONAL AERONAUTICS AND SPACE ADMINISTRATION HAMPTON VA LANGLEY RESEARCH CENTER

Abstract: The initial results of the application of special optical techniques to high-temperature emittance and reflectance studies of an ablation-material char and certain other refractory materials representative of those present in ablation residues formed during aerospace reentry operations are presented. Spectral hemispherical emittance and reflectance were determined with an image pyrometer integrated with an arc-imaging furnace for carbon, graphite, zirconia, and a phenolic-nylon ablation-material char at wavelengths from 0.37 micrometer to 0.72 micrometer for temperatures from 2100 deg K to 3700 deg K. The data obtained are compared with those of other investigations to the extent that the existence of comparable data permits. Surface-roughness properties of the materials studied were determined from measurements made with a light-section microscope. The dependence of the spectral hemispherical emittance of oxidized carbon at a wavelength of 0.65 micrometer on its surface-roughness properties was investigated experimentally and the emittance was found to be a linear function of the root-mean-square slope of the surface when the roughness is large compared with wavelength. p3

Limitations: APPROVED FOR PUBLIC RELEASE
Description: Technical note
Pages: 31
Report Date: MAR 65
Report Number: A107703