Surface Optics Corporation (SOC) operates a world-class measurement facility equipped for the most demanding spectral measurement tasks for spectral directional and bidirectional reflectance measurements for modeling, simulation, special effects and more.
Spectral measurements can be made in wavelength regions from the ultraviolet to long wave infrared and include one or all of the following types of reflectance measurements:
Directional or hemispheric reflectance: the fraction of the light incident on a sample at a given angle that is reflected back into the hemisphere.
Bidirectional Reflectance Distribution Function (BRDF): the distribution of light, described as a function of two angles, reflected back into the hemisphere from light incident at a given angle on a sample.
Monostatic Bidirectional Reflectance(enhanced backscatter measurement): a small portion of the BRDF measured at the direct backscattered angle using a laser interferometric reflectometer.
SOC also develops and expands on its off-the-shelf library of optical properties data for a variety of materials. This library can be purchased in whole or in part at considerable savings over the cost of individual measurements.
For more information on our database and its contents contact SOC.
You can also download the Optical Properties Database brochure.
- Spectral Reflectance Data for (52) rocks, (29) soils, (28) vegetation types, (41) construction materials, (38) paints, and (12) fabrics from 0.3 to 25 microns.
- Hemispherical, Directional, Diffuse and Specular
- Surface temperatures versus time-of-day, climate and orientation
- Complete solution for visual and infrared radiance simulation.
3D Models for Sensor Simulation
SOC is constantly developing computationally efficient polygonal models for accurate sensor simulation.
Unlike visual simulation models, sensor models require an intimate understanding of the physical nature and physics responsible for the signature of an object.
SOC’s extensive background in both Infrared and Radar sensor simulation and analysis is incorporated into all of our 3D models.