1.1 This test method describes an accurate technique for measuring the normal spectral emittance of electrically nonconducting materials in the temperature range from 1000 to 1800 K, and at wavelengths from 1 to 35 ?m. It is particularly suitable for measuring the normal spectral emittance of materials such as ceramic oxides, which have relatively low thermal conductivity and are translucent to appreciable depths (several millimetres) below the surface, but which become essentially opaque at thicknesses of 10 mm or less.
1.2 This test method requires expensive equipment and rather elaborate precautions, but produces data that are accurate to within a few percent. It is particularly suitable for research laboratories, where the highest precision and accuracy are desired, and is not recommended for routine production or acceptance testing. Because of its high accuracy, this test method may be used as a reference method to be applied to production and acceptance testing in case of dispute.
1.3 This test method requires the use of a specific specimen size and configuration, and a specific heating and viewing technique. The design details of the critical specimen furnace are presented in Ref (1), and the use of a furnace of this design is necessary to comply with this test method. The transfer optics and spectrophotometer are discussed in general terms.
1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents
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ASTM E423 – 71(2008): Standard Test Method for Normal Spectral Emittance
- Influence of KMnO4 Concentration on Infrared Emissivity o... — On TC4 Alloys by Micro-Arc Oxidation (Materials EISSN 1996-1944) Abstract: Ceramic coatings with high emissivity were fabricated on TC4 alloys by micro-arc oxidation technique (MAO) in mixed silicate and phosphate electrolytes with varying KMnO4 addition. The microstructure, phase and chemical composition were characterized by scanning electron microscope (SEM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy [...]
- Retrievals of the Far Infrared surface emissivity over th... — Research Article TITLE: “Retrievals of the Far Infrared surface emissivity over the Greenland Plateau using the Tropospheric Airborne Fourier Transform Spectrometer (TAFTS).” (See Author List below) ABSTRACT (Format Edited for easier online viewing) The Tropospheric Airborne Fourier Transform Spectrometer (TAFTS) measured near surface upwelling and downwelling radiances within the far infrared (FIR) over Greenland during [...]
- Emissivity as viewed on the Fuji & Co Piezo Science ... — A brief explanation of the topic of emissivity, that gets into the concept of spectral emissivity… a little. It deals with the total emissivity used in radiant heat transfer, but the basic concepts apply at any wavelength. Visit http://www.fuji-piezo.com/emissivi.htm online to read their [...]
- Reflectivity of Mineral Powders — From the Website of Ocean Optics, an applications note for their Jaz Spectrometer It begins: “Reflectance spectroscopy is a versatile technique than can be used to identify and characterize a range of powdered samples including mineral powders, grains in lunar samples, mining samples, natural deposits, soils and sediment core samples. In this application note, reflectance [...]
- Experimental verification of a multiband system for non-c... — Proc. SPIE 5258, 198 (2003); doi:10.1117/12.544574 Conference Title: IV Workshop on Atomic and Molecular Physics Conference Chair: Jozef Heldt Abstract Adam Mazikowski and Marcin Gnyba Gdansk Univ. of Technology (Poland) Recent studies about non-contact temperature measurement concern passive multiband radiometric systems. These systems give a potential possibility of accurate temperature measurements in case of unknown [...]