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Polarized spectral emittance from periodic micromachined surfaces. II. Doped silicon: Angular variation
Posted by: grp in Semiconductors, Solids & Liquids, tags: 3 to 14 micrometers, Si, SiliconPJ Hesketh, JN Zemel, B Gebhart - Physical Review B, 1988 - APS Polarized spectral emittance from periodic micromachined surfaces. II. VOLUME 37, NUMBER 18
From the Abstract:The polarized directional spectral (3 um <=lambda =>14um) emittances (PDSE’s) of highly doped, micromachined, periodic structures on silicon were measured…
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