Archive for the “Natural Materials” Category
Posted by: grp in Apply, Building Materials, Ceramics & Glasses, Coatings, General, Metals & Alloys, Natural Materials, Other Materials, Plastics, Products & Services, Reflectivity, Semiconductors, Theory, tags: , 3-5 micrometer waveband, 8-12 micrometer waveband, ET10, surface optics
San Diego CA, USA –Surface Optics’ ET10 measures emissivity values in two most commonly used spectral regions, 3 to 5 and 8 to 12 microns.
Its main application is to produce emissivity values for the infrared cameras.
Advanced IR cameras require the input of an emissivity value for accurate temperature calculations. The emissivity values obtained from tables can be far from real leading to large temperature uncertainties.
The ET10 can be used in the lab or in the field and on small or large objects. With the ET10 one can measure emissivity of any surface in just a few seconds.
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In the Optics InfoBase, by the American Institute of Physics’ Optical Society of America:
Authors: Abraham Kribus, Irna Vishnevetsky, Eyal Rotenberg, and Dan Yakir
Applied Optics, Vol. 42, Issue 10, pp. 1839-1846
Keywords (OCIS):
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
Abstract
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances… » View Full Text: PDF
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This web site gives the executive summary and table of contents for the Field Guide.
Here’s a summary of what the Field Guide is all about in the words of its authors:
EXECUTIVE SUMMARY
“Because of the rapid advance of airborne and satellite sensor technology in providing higher spectral resolution over progressively broader wavelength regions, there is a need for more (and more accurate) field measurements to complement overhead data. The purpose of this field guide is to facilitate such ground-based measurements, first through a review of the environmental factors affecting such measurements, second through an evaluation of the instrumentation involved, and third through a suggested approach to the measurement process.
“In evaluating environmental factors affecting spectral measurements in the field, the sources of radiance from a target are discussed in both the reflectance and emittance regions of the spectrum, as well as how those sources are modified by atmospheric attenuation and scattering, and the presence of clouds and wind.
“Another factor affecting all spectral measurements in the field is the computer typically used for instrument control and data storage. Computers tend to be the universal weak link in field spectrometers, because of their typical low tolerance for bright sunlight, temperature extremes, windblown dust, and rain. Various solutions to the computer problem are discussed, including the acquisition of hardened computers.
“The most commonly used field spectrometers are described, with advice on how to get the most out of each instrument. Then the pros and cons of each instrument are discussed with regard to different applications.
“Finally, how to approach field measurements is described, beginning with a thorough testing of a field instrument (and the field instrument user) in the laboratory. Approaches to data collection, record keeping, data reduction, and data analysis are discussed. A major conclusion is that much greater support for data analysis is necessary to reach the full potential of spectroscopic remote sensing for target identification”.
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Surface Optics Corporation (SOC) operates a world-class measurement facility equipped for the most demanding spectral measurement tasks for spectral directional and bidirectional reflectance measurements for modeling, simulation, special effects and more.
Spectral measurements can be made in wavelength regions from the ultraviolet to long wave infrared and include one or all of the following types of reflectance measurements:
Directional or hemispheric reflectance: the fraction of the light incident on a sample at a given angle that is reflected back into the hemisphere.
Bidirectional Reflectance Distribution Function (BRDF): the distribution of light, described as a function of two angles, reflected back into the hemisphere from light incident at a given angle on a sample.
Monostatic Bidirectional Reflectance(enhanced backscatter measurement): a small portion of the BRDF measured at the direct backscattered angle using a laser interferometric reflectometer.
SOC also develops and expands on its off-the-shelf library of optical properties data for a variety of materials. This library can be purchased in whole or in part at considerable savings over the cost of individual measurements.
For more information on our database and its contents contact SOC.
You can also download the Optical Properties Database brochure.
A list of FAQs regarding the database, and information on using the databases in 3D sensor simulation.
- Spectral Reflectance Data for (52) rocks, (29) soils, (28) vegetation types, (41) construction materials, (38) paints, and (12) fabrics from 0.3 to 25 microns.
- Hemispherical, Directional, Diffuse and Specular
- Surface temperatures versus time-of-day, climate and orientation
- Complete solution for visual and infrared radiance simulation.
3D Models for Sensor Simulation
SOC is constantly developing computationally efficient polygonal models for accurate sensor simulation.
Unlike visual simulation models, sensor models require an intimate understanding of the physical nature and physics responsible for the signature of an object.
SOC’s extensive background in both Infrared and Radar sensor simulation and analysis is incorporated into all of our 3D models.
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NASA Portable Infrared Reflectometer Designed and Manufactured
The optical properties of materials play a key role in spacecraft thermal control. In space, radiant heat transfer is the only mode of heat transfer that can reject heat from a spacecraft.
One of the key properties for defining radiant heat transfer is emittance, a measure of how efficiently a surface can reject heat in comparison to a perfect black body emitter.
Heat rejection occurs in the infrared region of the spectrum, nominally in the range of 2 to 25 micrometer.
To calculate emittance, one obtains the reflectance over this spectral range, calculates spectral absorptance by difference, and then uses Kirchhoff’s Law and the Stefan-Boltzmann equation to calculate emittance.

Portable infrared reflectometer for evaluating emittance. Photo from NASA
A portable infrared reflectometer, the SOC–400t, was designed and manufactured to evaluate the emittance of surfaces and coatings in the laboratory or in the field.
It was developed by Surface Optics Corporation under a contract with the NASA Glenn Research Center at Lewis Field to replace the Center’s aging Gier-Dunkle DB–100 infrared reflectometer.
The specifications for the new instrument include a wavelength range of 2 to 25 micrometer; reflectance repeatability of ±1 percent; self-calibrating, near-normal spectral reflectance measurements; a full scan measurement time of 3.5 min, a sample size of 1.27 cm (0.5 in.); a spectral resolution selectable from 4, 8, 16, or 32 cm–1; and optical property characterization utilizing an automatic integration to calculate total emittance in a selectable temperature range.
The computer specified to drive the software is a laptop with a menu-driven operating system for setup and operation, a full data base manager, and a full data analysis capability through MIDAC Grams/32 software (MIDAC Corporation, Irvine, California).
Spectral scanning is achieved through the use of a Fourier Transform Infrared (FTIR) Michelson interferometer. In addition, the reflectometer’s size and weight make it conducive to portable operation.
Although most of the planned uses for the instrument are expected to be in the laboratory, some field operations are anticipated. The only requirement for field operation is a source of power (115 V alternating current).
NASA Glenn took delivery of this world-unique, portable infrared reflectometer in January 1999. It is a resounding success, and an evaluation of thermal control materials for NASA and aerospace customers is currently underway.
Find out more about this research.
Glenn contact: Dr. Donald A. Jaworske, (216) 433–2312, Donald.A.Jaworske@grc.nasa.gov
Author: Dr. Donald A. Jaworske
Headquarters program office: OSS (ATMS)
Programs/Projects: Space Power, ISS, Aerospace Industry
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Measuring the spectral emissivity of rocks and the minerals that form them, By Miroslav Danov, Dimitar Stoyanov, and Vitchko Tsanev.
It is an online paper at the SPIE news room website. The tagline for the paper reads:
“A new ground-based technique measures minerals in their natural conditions, a prerequisite for satellite data processing”.
The paper discusses a new measurement technique that uses both a scanning FTIR spectrometer and a gold-plated hemispherical mirror and provides data from tests using limestone as the test subject material.
Several references are cited, as follows:
Jingmin Dai, Xinbei Wang, Guibin Yuan, Fourier transform spectrometer for spectral emissivity measurement in the temperature range between 60 and 1500°C, J. Phy. 13, pp. 63-66, 2005.
S. Fonti, Spectral emissivity as a tool for the interpretation of Martian data: A laboratory approach, 32nd Annual Lunar and Planetary Science Conference, no. 1279, pp. 12-16, 2001.
A. M. Baldridge, P. R. Christensen, A laboratory technique for thermal infrared measurement of hydrated samples, 38th Lunar and Planetary Science Conference, pp. 2407, 2007. Lunar and Planetary Science XXXVIII, held March 12-16, 2007 in League City, Texas. LPI Contribution No. 1338
Z. Wan, D. Ng, J. Dozier, Spectral emissivity measurements of land-surface materials and related radiative transfer simulations, Adv. Space Reg. 14, no. 3, pp. 91-94, 1994.
T. W. Stuhlinger, E. L. Dereniak, F. O. Bartell, Bidirectional reflectance distribution function of gold-plated sandpaper, Appl. Optics 20, no. 15/1, 1981.
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The spectral library is hosted by the Mars Space Flight Facility at Arizona State University (ASU) consists of thermal infrared emission spectra (typically 2000 - 220 cm-1) of a variety of geologic materials.
It is open and free, but one needs to register with a valid email address and take the time to learn how to access the data and obtain plots. It is not a trivial task.
Each spectrum comes with descriptive information, sample quality, and a comments field that describes any appropriate, related information.
To quote from the introduction to the library about the sources of data:
“Emission spectra were acquired using a Nicolet Nexus 670 interferometric spectrometer equipped with a CsI beamsplitter and an uncooled deuterated triglycine sulfate (DTGS) detector; the spectral range of the instrument is from 2000 — 220 cm-1 (5 — ~45 microns). Both the spectrometer and the sample chamber/glovebox were continuously purged with nitrogen gas during sample analysis to minimize atmospheric H2O and CO2 which also have absorption features in the 2000-220 cm-1 region of the spectrum. The particulate samples were heated in an oven to 80°C to improve the signal to noise ratio during spectral analysis (this temperature is maintained during analysis by placement of the sample cup on a heater element). The samples were raised into a water-cooled sample chamber that closely approximates a blackbody cavity [Ruff et al., 1997]. A total of 270 scans at 2-cm-1 sampling were taken over ~7 minutes and averaged together by the spectrometer. In the case of a hand sample, active heating during measurement is not possible. Hand samples were taken directly from the oven and placed into the sample chamber and 180 scans were taken over a period of ~5 minutes to minimize the effects of sample cooling. The spectral calibration method is a variation of method 1 of Christensen and Harrison [1993] as described in detail by Ruff et al., [1997].”
References cited above:
“Christensen, P.R., and S.T. Harrison, Thermal infrared emission spectroscopy of natural surfaces: Application to desert varnish coatings on rocks, J. Geophys. Res., 98 (B11), 19,819-19,834, 1993.“Christensen, P.R., J.L. Bandfield, V.E. Hamilton, D.A. Howard, M.D. Lane, J.L. Piatek, S.W. Ruff, and W.L. Stefanov, A thermal emission spectral library of rock-forming minerals, J. Geophys. Res., 105,9735-9739, 2000. {ED NOTE: PDF DOWNLOAD}
“Feely, K.C. and P.R. Christensen, Quantitative compositional analysis using thermal emission spectroscopy: Application to igneous and metamorphic rocks, J. Geophys. Res., 104, 24195-24210, 1999.
“Lane, M.D. and P.R. Christensen, Thermal infrared emission spectroscopy of salt minerals predicted for Mars, Icarus, 135, 528-536, 1998.”"Lane, M.D., Midinfrared emission spectroscopy of sulfate and sulfate-bearing minerals, American Mineralogist, in press, 2006.
“Ruff, S.W., P.R. Christensen, P.W. Barbera, and D.L. Anderson, Quantitative thermal emission spectroscopy of minerals: A laboratory technique for measurement and calibration, J. Geophys. Res., 102, 14,899-14,913, 1997.”
Further reference publications related to the work at ASU may be viewed on the ASU website.
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This linked website discusses the background and flight of the instrument and also provides some interesting spectral emissivity curves for Quartz (SiO2), Feldspar* and Hornblende** and an equal mixture of the two,
The TES instrument first flew aboard the Mars Observer spacecraft that was lost. The TES instrument was rebuilt and launched along with instruments aboard the new Mars Global Surveyor spacecraft.
The purpose of the TES device is to measure the spectral distribution of thermal infrared radiation emitted from Martian surfaces. The TES technique, can tell us much about the geology and atmosphere of Mars.
One can learn much about this method and the device by visiting the Arizona State University website pages that provide much more detail and background and reading through the TES News Archives.
[NOTE: The above curves actually exist on the Arizona State University website on their webpage address: http://tes.asu.edu/MARS_SURVEYOR/MGSTES/mixed_spec.gif]

The Thermal Emission Spectrometer is a scientific instrument and also Thermal Emission Spectroscopy is a measurement technique.
* K-feldspar end member KAlSi 3O 8, Albite end member NaAlSi 3O 8 or Anorthite end member CaAl 2Si 2O according to the Wikipedia article on Feldspar.
** The general formula (for Hornblende) can be given as (Ca,Na) 2-3(Mg,Fe,Al) 5(Al,Si) 8O 22(OH,F) 2 , according to the Wikipedia article on Hornblende..
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The ASTER spectral library, is a compilation of almost 2000 spectra of natural and man made materials that is searchable by material. The search returns a list of materials that match your search criteria, you can see a scaled plot of the spectrum and the ancillary information information for the spectrum, you can also download the spectral data.
Data and (No. of samples) are: Minerals (1348), Rocks (244), Soils (58), Vegetation (4), Water, Snow & Ice (9), Man made materials (56), Lunar (17) and Meteorites (60)
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A downloadable PDF Format copy of a technical paper by Yan Chen, Sunny Sun-Mack, SAIC, Hampton, VA USA and Patrick Minnis, David F. Young, William L. Smith, Jr., Atmospheric Sciences, NASA Langley Research Center, Hampton, VA USA. A paper that was presented at SPIE’s 3rd International Asia-Pacific Environmental Remote Sensing Symposium 2002: entitled Remote Sensing of the Atmosphere, Ocean, Environment, and Space, in Hangzhou, China, October 23-27, 2002.
ABSTRACT: “Surface emissivity is essential for many remote sensing applications including the retrieval of the surface skin temperature from satellite-based infrared measurements, determining thresholds for cloud detection and for estimating the emission of longwave radiation from the surface, an important component of the energy budget of the surface-atmosphere interface. In this paper, data from the Terra MODIS (MODerate-resolution Imaging Spectroradiometer) taken at 3.7, 8.5, 10.8, 12.0 ?m are used to simultaneously derive the skin temperature and the surface emissivities at the same wavelengths. The methodology uses separate measurements of the clear-sky temperatures that are determined by the CERES (Clouds and Earth’s Radiant Energy System) scene classification in each channel during the daytime and at night. The relationships between the various channels at night are used during the day when solar reflectance affectsthe 3.7-?m data. A set of simultaneous equations is then solved to derive the emissivities. Global results are derived from MODIS. Numerical weather analyses are used to provide soundings for correcting the observed radiances for atmospheric absorption. These results are verified and will be available for remote sensing applications.”
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