Posted by: grp in Apply, Building Materials, Ceramics & Glasses, Coatings, General, Metals & Alloys, Natural Materials, Other Materials, Plastics, Products & Services, Reflectivity, Semiconductors, Theory, tags: , 3-5 micrometer waveband, 8-12 micrometer waveband, ET10, surface optics
San Diego CA, USA –Surface Optics’ ET10 measures emissivity values in two most commonly used spectral regions, 3 to 5 and 8 to 12 microns.
Its main application is to produce emissivity values for the infrared cameras.
Advanced IR cameras require the input of an emissivity value for accurate temperature calculations. The emissivity values obtained from tables can be far from real leading to large temperature uncertainties.
The ET10 can be used in the lab or in the field and on small or large objects. With the ET10 one can measure emissivity of any surface in just a few seconds.
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IR Emission Spectroscopy of Molten Salts and Other Liquids Using Thick Samples as Reference
J. Hvistendahl, E. Rytter, and H. A. Øye
Applied Spectroscopy, Vol. 37, Issue 2, pp. 182-187 (1983)
Abstract
“The IR emittance of liquids relative to a blackbody is dependent on the reflectivity at the surface of the sample. This dependency leads to distortions in the bandshapes except when the absorption coefficient or the sample thickness is very low. The use of an opaque (i.e. very thick) sample as a reference eliminates the distortions in the bandshapes. A new emittance ?* = (emission of a thin sample)/(emission of an opaque sample) has been introduced. A theoretical analysis as well as experimental work on chloroaluminate melts demonstrate that the emittance ?* gives a better representation of the ideal sample property of interest, i.e., the internal transmittance of the sample, than the usual emittance with a blackbody as a reference.”
Citation
J. Hvistendahl, E. Rytter, and H. A. Øye, “IR Emission Spectroscopy of Molten Salts and Other Liquids Using Thick Samples as Reference,” Appl. Spectrosc. 37, 182-187 (1983)
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Emittance measurements on infrared windows exhibiting wavelength dependent diffuse transmittance
S. E. Hatch
Applied Optics, Vol. 1, Issue 5, pp. 595-601
Citation
S. E. Hatch, “Emittance measurements on infrared windows exhibiting wavelength dependent diffuse transmittance,” Appl. Opt. 1, 595-601 (1962)
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Spectral emittance of refractory materials
Henry H. Blau, Jr. and John R. Jasperse
Applied Optics, Vol. 3, Issue 2, pp. 281-(1964)
Citation
H. H. Blau, Jr. and J. R. Jasperse, “Spectral emittance of refractory materials,” Appl. Opt. 3, 281- (1964)
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