Spectral Emissivity & Emittance

“The InfraRed Sea Surface Emissivity (IRSSE) model was developed for use in the Global Data Assimilation System (GDAS) at NCEP/EMC. Previously, the GDAS used an IRSSE model based on Masuda et al (1988).

“The Masuda model doesn’t account for the effect of enhanced emission due to reflection from the sea surface (only an issue for larger view angles) and the implementation was based on coarse spectral resolution emissivity data making its application to high resolution instruments, such as AIRS, problematic.

“The old IRSSE model has been upgraded to use sea surface emissivities derived via the Wu and Smith (1997) methodology as described in van Delst and Wu (2000).

“The emissivity spectra are computed assuming the infrared sensors are not polarised and using the data of Hale and Querry (1973) for the refractive index of water, Segelstein (1981) for the extinction coefficient, and Friedman (1969) for the salinitiy/chlorinity corrections.

“Instrument spectral response functions (SRFs) are used to reduce the emissivity spectra to instrument resolution. These are the quantities predicted by the IRSSE model.”

ASTM E307-72(2002):

Standard Test Method for Normal Spectral Emittance at Elevated Temperatures

Developed by Subcommittee: E21.04

Book of Standards Volume: 15.03
“1. Scope

“1.1 This test method describes a highly accurate technique for measuring the normal spectral emittance of electrically conducting materials or materials with electrically conducting substrates, in the temperature range from 600 to 1400 K, and at wavelengths from 1 to 35 ?m.

“1.2 The test method requires expensive equipment and rather elaborate precautions, but produces data that are accurate to within a few percent. It is suitable for research laboratories where the highest precision and accuracy are desired, but is not recommended for routine production or acceptance testing. However, because of its high accuracy this test method can be used as a referee method to be applied to production and acceptance testing in cases of dispute.

“1.3 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only.

“1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.”

Title: STANDARDIZATION OF THERMAL EMITTANCE MEASUREMENTS. PART 5. NORMAL SPECTRAL EMITTANCE, 800-1400 K (ABSTRACT BELOW)
DOWNLOAD FULL REPORT IN PDF FORMAT

Corporate Author : NATIONAL BUREAU OF STANDARDS GAITHERSBURG MD

Personal Author(s) : Harrison, William N. ; Richmond, Joseph C. ; Shorten, Frederick J. ; Joseph, Horace M.

Handle / proxy Url : http://handle.dtic.mil/100.2/AD426846

Report Date : NOV 1963

Pagination or Media Count : 99

Abstract: Equipment and procedures were developed to measure normal spectral emittance of specimens that can be heated by passing a current through them, at temperatures in the range of 800 to 1400 K, and over the wavelength range of 1 to 15 microns. A data-processing attachment for the normal spectral emittance equipment was designed to (1) automatically correct the measured emittance for ‘100% line’ and ‘zero line’ errors on the basis of previously-recorded calibration tests; (2) record the corrected spectral emittance values and wavelengths at preselected wavelength intervals on punched paper tape in form suitable for direct entry into an electronic digital computer; and (3) to compute during a spectral emittance test on a specimen the total normal emittance, or absorptance for radiant energy of any known spectral distribution of flux, of the specimen. Working standards of normal spectral emittance having low, intermediate and high emittance values, respectively, were prepared and calibrated for use in other laboratories to check the operation of equipment and procedures used for measuring normal spectral emittance.

For your reference, there are several that deal with emittance that may be of interest to you.

For your convenience, they are on the IRINFO.org web pages at the following links:

www.irinfo.org/tip_of_week_2004.html#t02092004

www.irinfo.org/tip_of_week_2004.html#t04052004

www.irinfo.org/tip_of_week_2003.html#t09292003

www.irinfo.org/tip_of_week_2004.html#t08022004

www.irinfo.org/tip_of_week_2005.html#t09122005

www.irinfo.org/tip_of_week_2005.html#t09192005

www.irinfo.org/tip_of_week_2005.html#t09262005

www.irinfo.org/tip_of_week_2007.html#t05282007

Enjoy!

NASA Portable Infrared Reflectometer Designed and Manufactured

The optical properties of materials play a key role in spacecraft thermal control. In space, radiant heat transfer is the only mode of heat transfer that can reject heat from a spacecraft.

One of the key properties for defining radiant heat transfer is emittance, a measure of how efficiently a surface can reject heat in comparison to a perfect black body emitter.

Heat rejection occurs in the infrared region of the spectrum, nominally in the range of 2 to 25 micrometer.

To calculate emittance, one obtains the reflectance over this spectral range, calculates spectral absorptance by difference, and then uses Kirchhoff’s Law and the Stefan-Boltzmann equation to calculate emittance.

Portable infrared reflectometer for evaluating emittance. Photo from NASA

A portable infrared reflectometer, the SOC–400t, was designed and manufactured to evaluate the emittance of surfaces and coatings in the laboratory or in the field.

It was developed by Surface Optics Corporation under a contract with the NASA Glenn Research Center at Lewis Field to replace the Center’s aging Gier-Dunkle DB–100 infrared reflectometer.

The specifications for the new instrument include a wavelength range of 2 to 25 micrometer; reflectance repeatability of ±1 percent; self-calibrating, near-normal spectral reflectance measurements; a full scan measurement time of 3.5 min, a sample size of 1.27 cm (0.5 in.); a spectral resolution selectable from 4, 8, 16, or 32 cm^–1; and optical property characterization utilizing an automatic integration to calculate total emittance in a selectable temperature range.

The computer specified to drive the software is a laptop with a menu-driven operating system for setup and operation, a full data base manager, and a full data analysis capability through MIDAC Grams/32 software (MIDAC Corporation, Irvine, California).

Spectral scanning is achieved through the use of a Fourier Transform Infrared (FTIR) Michelson interferometer. In addition, the reflectometer’s size and weight make it conducive to portable operation.

Although most of the planned uses for the instrument are expected to be in the laboratory, some field operations are anticipated. The only requirement for field operation is a source of power (115 V alternating current).

NASA Glenn took delivery of this world-unique, portable infrared reflectometer in January 1999. It is a resounding success, and an evaluation of thermal control materials for NASA and aerospace customers is currently underway.

Find out more about this research.

Glenn contact: Dr. Donald A. Jaworske, (216) 433–2312, Donald.A.Jaworske@grc.nasa.gov

Author: Dr. Donald A. Jaworske

Headquarters program office: OSS (ATMS)

Programs/Projects: Space Power, ISS, Aerospace Industry