Spectral Emissivity & Emittance

Standard Test Method for Normal Spectral Emittance at Elevated Temperatures of Nonconducting Specimens ASTM E423 - 71(2008) - www.ASTM.org

1. Scope

1.1 This test method describes an accurate technique for measuring the normal spectral emittance of electrically nonconducting materials in the temperature range from 1000 to 1800 K, and at wavelengths from 1 to 35 ?m. It is particularly suitable for measuring the normal spectral emittance of materials such as ceramic oxides, which have relatively low thermal conductivity and are translucent to appreciable depths (several millimetres) below the surface, but which become essentially opaque at thicknesses of 10 mm or less.

1.2 This test method requires expensive equipment and rather elaborate precautions, but produces data that are accurate to within a few percent. It is particularly suitable for research laboratories, where the highest precision and accuracy are desired, and is not recommended for routine production or acceptance testing. Because of its high accuracy, this test method may be used as a reference method to be applied to production and acceptance testing in case of dispute.

1.3 This test method requires the use of a specific specimen size and configuration, and a specific heating and viewing technique. The design details of the critical specimen furnace are presented in Ref (1), and the use of a furnace of this design is necessary to comply with this test method. The transfer optics and spectrophotometer are discussed in general terms.

1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

2. Referenced Documents

E349 Terminology Relating to Space Simulation - www.ASTM.org

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Spectral Emissivity of the Schumann-Runge Bands of Oxygen
Y. Ben-Aryeh
JOSA, Vol. 58, Issue 5, pp. 679- (1968)

Citation
Y. Ben-Aryeh, “Spectral Emissivity of the Schumann-Runge Bands of Oxygen,” J. Opt. Soc. Am. 58, 679- (1968)

Spectral-Emissivity Measurements of the 4.3-mu CO₂ Band between 2560 degrees and 3000 degrees K
C. C. Ferriso, C. B. Ludwig, and L. Acton
JOSA, Vol. 56, Issue 2, pp. 171- (1966)

Citation
C. C. Ferriso, C. B. Ludwig, and L. Acton, “Spectral-Emissivity Measurements of the 4.3-mu CO2 Band between 2560 degrees and 3000 degrees K,” J. Opt. Soc. Am. 56, 171- (1966)

Measurement of spectral emissivity from 2 micrometers to 15 micrometers
Charles D. Reid and E. D. McAlister
JOSA, Vol. 49, Issue 1, pp. 78- (1959)

Citation
C. D. Reid and E. D. McAlister, “Measurement of spectral emissivity from 2 micrometers to 15 micrometers,” J. Opt. Soc. Am. 49, 78- (1959)
http://www.opticsinfobase.org/abstract.cfm?URI=josa-49-1-78

Infrared spectral emittance measurements of optical materials
D. L. Stierwalt
Applied Optics, Vol. 5, Issue 12, pp. 1911-(1966)

» View Full Text: PDF (746 KB)

Citation
D. L. Stierwalt, “Infrared spectral emittance measurements of optical materials,” Appl. Opt. 5, 1911- (1966)

Authors: Madding, Robert P.\
Affiliation: AA(Inframetrics, Inc.)
Publication:
Proc. SPIE Vol. 3700, p. 393-401, Thermosense XXI, Dennis H. LeMieux; John R. Snell; Eds. (SPIE Homepage)
Publication Date:03/1999
Origin:SPIEAbstract Copyright:
(c) 1999 SPIE–The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Bibliographic Code: 1999SPIE.3700..393M
Abstract: Extraction of temperatures or temperature differences with thermography is not possible without knowledge of the target emissivity…

Peter J. Hesketh, Jay N. Zemel & Benjamin Gebhart ; Physical Review B.37.10795
VOLUME 37, NUMBER 18 1988

From the Abstract: The normal, polarized spectral (3 um <=lambda =>14um) emittances of highly doped, micromachined, periodic structures on heavily phosphorus-doped (110) silicon ([P]?5×10¹⁹ cm^-3) were measured for …..

In the Optics InfoBase, by the American Institute of Physics’ Optical Society of America:
Authors: Abraham Kribus, Irna Vishnevetsky, Eyal Rotenberg, and Dan Yakir

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Applied Optics, Vol. 42, Issue 10, pp. 1839-1846
Keywords (OCIS):
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
Abstract
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances…  » View Full Text: PDF

By: Hunter, A.; Adams, B.; Ramanujam, R.
Advanced Thermal Processing of Semiconductors, 2003. RTP 2003. 11th IEEE International Conference on RTP
Volume , Issue , 23-26 Sept. 2003 Page(s): 85 - 88
Digital Object Identifier 10.1109/RTP.2003.1249127
Summary:

The design of an integrating reflectometer specific to the optical and spectral requirements of rapid thermal processing (RTP) is discussed. We report reflectance measurements of various materials. These measurements are correlated to in-situ emittance measurements recorded during rapid thermal processing. We also present the design of an optimized emissometer for an RTP chamber. We propose a means for correlating room temperature reflectance measurements to emittance standards for RTP.

View citation and abstract

This web site gives the executive summary and table of contents for the Field Guide.

Here’s a summary of what the Field Guide is all about in the words of its authors:

EXECUTIVE SUMMARY

“Because of the rapid advance of airborne and satellite sensor technology in providing higher spectral resolution over progressively broader wavelength regions, there is a need for more (and more accurate) field measurements to complement overhead data. The purpose of this field guide is to facilitate such ground-based measurements, first through a review of the environmental factors affecting such measurements, second through an evaluation of the instrumentation involved, and third through a suggested approach to the measurement process.

“In evaluating environmental factors affecting spectral measurements in the field, the sources of radiance from a target are discussed in both the reflectance and emittance regions of the spectrum, as well as how those sources are modified by atmospheric attenuation and scattering, and the presence of clouds and wind.

“Another factor affecting all spectral measurements in the field is the computer typically used for instrument control and data storage. Computers tend to be the universal weak link in field spectrometers, because of their typical low tolerance for bright sunlight, temperature extremes, windblown dust, and rain. Various solutions to the computer problem are discussed, including the acquisition of hardened computers.

“The most commonly used field spectrometers are described, with advice on how to get the most out of each instrument. Then the pros and cons of each instrument are discussed with regard to different applications.

“Finally, how to approach field measurements is described, beginning with a thorough testing of a field instrument (and the field instrument user) in the laboratory. Approaches to data collection, record keeping, data reduction, and data analysis are discussed. A major conclusion is that much greater support for data analysis is necessary to reach the full potential of spectroscopic remote sensing for target identification”.