Jan 06 2008

Polarized spectral emittance from periodic micromachined surfaces. I. Doped silicon: The normal direction

Posted by: grp in References, Semiconductors, Solids & Liquids

Peter J. Hesketh, Jay N. Zemel & Benjamin Gebhart ; Physical Review B.37.10795
VOLUME 37, NUMBER 18 1988

From the Abstract: The normal, polarized spectral (3 um <=lambda =>14um) emittances of highly doped, micromachined, periodic structures on heavily phosphorus-doped (110) silicon ([P]?5×10¹⁹ cm^-3) were measured for …..

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