Dec
10
2007
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Systematic Errors in the Measurement of Emissivity Caused by Directional Effects
Posted by: grp in Natural Materials, ReferencesIn the Optics InfoBase, by the American Institute of Physics’ Optical Society of America:
Authors: Abraham Kribus, Irna Vishnevetsky, Eyal Rotenberg, and Dan Yakir
Applied Optics, Vol. 42, Issue 10, pp. 1839-1846
Keywords (OCIS):
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
Abstract
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances… » View Full Text: PDF
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